Taken with an Olympus/Innov-X DP-2000 X-Ray Fluorescence spectrometer with a Si-Drift detector (Hardware settings: Source: Rh; Voltage: 15 kV, Analytical Mode-FP algorithm, acquisition time 34s). Note that the region of of 2.5 to 12.5 keV, not shown, is complicated with peaks (e.g., target and diffraction lines) that are not fluorescense from the aluminum. The sample contains <1% combined of iron and copper, not shown.