XRF Spectrum of pure Thallium, taken with an Innov-X a-2000 X-Ray Fluorescence spectrometer with a Si-PiN detector (Hardware settings: Source: Ta; Voltage: 40 kV; Current: 24 uA; Filter: 250 uM Cu, Analytical Mode-FP algorithm, acquisition time 34s). The sample was coated in oil and separated from the detector using a 1.0-miL Mylar® sheet.
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